Keysight Agilent HP 8753E RF Network Analyzer 30 kHz to 3 or 6 GHz
*Frequency range: 30kHz~3 or 6GHz
*Integrated S-parameter testing device with solid-state conversion
*A dynamic range of up to 110dB
*Fast measurement speed and data transmission rate
*Large LCD display with VGA output for external monitoring
*Simultaneously display all 4 S parameters
*Store/call instrument status and data to the built-in floppy disk drive
*Optional time-domain measurement and scanning harmonic measurement
The 8753E RF network analyzer provides a combination of speed, performance, and ease of use to meet the testing needs of research laboratories or manufacturing. The 8753E provides a satisfactory solution for characterizing the linear and nonlinear characteristics of active or passive networks, components, and subsystems with its integrated S-parameter testing device covering a frequency range of 3 or 6GHz, dynamic range of up to 110dB, and frequency and power scanning. The new microprocessor used enables measurement and data transfer rates to be up to 7 times faster than previous models. The characteristic of a network analyzer is that it has two independent measurement channels, which can simultaneously measure and display all four S-parameters.
You can choose to display any combination of reflection and transmission parameters using amplitude, phase, group delay, Smith chart, polar coordinates, standing wave ratio, or time-domain format. The user-friendly dedicated function keys can quickly access various measurement functions. Measurement results can be observed by overlapping or separating screens on a high-resolution LCD color display with up to 4 scale grids. In order to drive larger external monitors for easier observation, VGA compatible outputs have been added.
An integrated synthesis source with good universality and performance provides an output power of up to 10mW (up to 100mW with option 011), 1Hz frequency resolution, linear frequency, logarithmic frequency, list frequency, CW, and power scanning functions. Three tuned receivers can perform independent power measurements or simultaneous ratio measurements within a wide dynamic range of 105dB at 6GHz (with option 006 frequency extension) or 110dB at 3GHz (standard). The integrated testing device can measure the transmission and reflection characteristics of devices up to 6GHz without using a frequency multiplier.
For convenient and accurate measurement in non coaxial systems, TRL */LRM * 1 calibration is provided. By using the built-in adapter to remove calibration technology, high-precision measurement of non insertable devices can also be achieved. The high stability frequency reference (option 1D5) improves the frequency measurement accuracy for high-Q devices such as surface acoustic wave (SAW) devices, crystal resonators, or dielectric resonant filters. In order to improve the flexibility of configuration, option 011 has removed the built-in testing device so that one can choose the testing device they need.
The 8753E option 011 can be used in conjunction with the 85046A/B and 85047A S-parameter testing devices, as well as specialized testing devices for other special applications. The new option for automated production can remove internal displays and reduce instrument costs (option 1DT). The improved production efficiency of the testing timing function allows for quick and repetitive execution of complex tasks with a single input. In the sequential working mode, the analyzer only needs to measure once from the panel to store the input, so there is no need for additional programming. External devices can also be controlled through parallel or IB ports using test timing. Other productivity features include built-in floppy disk drives that support LIF and DOS formats, non-volatile memory, serial and parallel interfaces, DIN keyboard interfaces, and real-time clocks that provide time recording for print output and files. It also includes limit testing, arbitrary frequency testing, and marker tracking functions. By using the list scanning method to select the special frequency to be tested and setting independent intermediate frequency bandwidth and power levels in each frequency range, the measurement time can be shortened. Segmented calibration and interpolation error correction can improve the vector accuracy on a certain section of the calibrated frequency range of the analyzer. In order to provide more advanced characterization of nonlinear devices, option 002 has added harmonic measurement function for testing. The scanning second and total harmonic levels of the amplifier can be displayed directly or as numbers relative to the fundamental wave. Press a button to measure harmonics up to -40. Power meter calibration provides stable amplitude power to devices that are sensitive to input or output levels.
8753E automatically controls the 436A, 437B, 438A, EPM-4441A or EPM-444A power meters to adjust the power at any point in the testing system to the accuracy of the power meter, or calibrates the network analyzer receiver for accurate power measurement. In order to measure mixers, tuners, and other frequency conversion devices, frequency bias operation allows for tuning of the network analyzer independently of the receiver. The analyzer can easily measure frequency conversion loss, phase, group delay, and mixer tuning using fixed or scanning intermediate frequency testing methods. Time domain analysis utilizes option 010 to observe the reflection or transmission response in the time domain. This analyzer calculates the fast Fourier inverse transform of frequency domain data to display the relationship between reflection coefficient or transmission coefficient over time. Two time-domain analysis methods can observe the step response or impulse response of the device. Timed gating can be used to remove some unwanted responses, such as connector mismatch, and the gating result can be displayed in the time domain or frequency domain. 1TRL * and LRM * are the three sampler execution methods of direct through reflection transmission line and transmission line reflection matching calibration techniques. Summary of Technical Indicators: The integrated S-parameter testing device provides complete forward and reverse measurements with 50 Ω (standard) or 75 Ω (option 075).
The external testing device is provided by option 011 of 8753E.
Test port output frequency characteristic range: 30kHz~3GHz (standard) 30kHz~6GHz (option 006) 300kHz~3GHz (option 011) 30kHz~6GHz (options 011, 006)
Resolution: 1Hz Accuracy: ± 10ppm (at 25 ºC± 5 ºC)
Output characteristic power range:- 85~+10dBm;- 85~+8dBm (option 075)
Resolution: 0.05dB Scanning range: 25dB
Level accuracy: ± 1.0dB (relative to 0dBm output level)
Linear level (30kHz~300kHz typical value) (-15~+5dBm) ± 0.2dB (+5~+10dBm) ± 0.5dB
Impedance: 50 Ω (standard); 75 Ω (Option 075)
Second harmonic:<-25dBc at+10dBm (16MHz~3GHz)
Third harmonic:<-25dBc at+10dBm (16MHz~2GHz)
Non harmonic parasitic signals (typical values) related to mixers:<-30dBc at+10dBm
Test port input characteristics frequency range: 30kHz~3GHz (standard) 30kHz~6GHz (option 006) average noise level 3kHz BW:- 82dBm(<3GHz), -77dBm(3~6GHz) 10Hz BW: -102dBm(<3GHz), -97dBm(3~6GHz)
*Input voltage level:+ 10dBm damage level: ± 26dBm or 35Vdc Impedance: 50 Ω (75 Ω when using option 075)
Harmonic: (Option 002)
Second harmonic:<-15dBc at+8dBm
Third harmonic:<-30dBc harmonic measurement accuracy at+8dBm (at 25 ºC± 5 ºC): 16MHz~3GHz: ±1dB 3GHz~6GHz: ± 3dB (with option 006)
Harmonic measurement dynamic range -40dBc (output=-10dBm, input<-15dBm)
Group delay characteristic range: 1/(2 x minimum aperture) aperture (optional)
*20% of the frequency interval minimum: (frequency interval)/(dot count -1)
Group delay accuracy (in seconds): ± (phase accuracy) (in degrees)/(360 x aperture (Hz))
Structural characteristic dimensions: 425 (width) mm × 222 (height) mm × 457 (length) mm
Weight: Net weight 21 kilograms
Q: Who are we?
A: Dongguan Qihang Electronic Technology Co., Ltd. is a professional company engaged in the research and development, sales, maintenance, measurement, technical consulting, and provision of Bluetooth RF testing systems and testing solutions for RF, microwave, and electronic testing instruments.
Q: How to ensure quality?
A: Before shipment, our quality inspector will conduct a comprehensive test of the product to ensure that the customer receives the instrument without any issues
Q: What can I buy from here?
Q: We can provide various instruments for Keysight, Ceyear, Tektronix, Rohde&Schwarz, Agilent, Keithley, Anritsu, and Lecroy
Q: Why do you want to purchase from us instead of other suppliers?
A: We have good prices and the advantage of overseas warehouses, which can make the goods arrive faster. And a good after-sales solution.
Q: Where do you ship from and how long is the delivery time?
A: Shipping from Guangdong, China, with a delivery time of 15 working days after getting the payment.
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